Resonant control of an atomic force microscope micro-cantilever for active Q control
نویسندگان
چکیده
منابع مشابه
Resonant control of an atomic force microscope micro-cantilever for active Q control.
Active Q control may be used to modify the effective quality (Q) factor of an atomic force microscope (AFM) micro-cantilever when operating in tapping mode. The control system uses velocity feedback to obtain an effective cantilever Q factor to achieve optimal scan speed and image resolution for the imaging environment and sample type. Time delay of the cantilever displacement signal is the mos...
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The atomic force microscope (AFM) has become an essential tool for the measurement of surface characteristics of diverse materials on a microand nanoscale level [1]. The resolution of measurements for the AFM cantilever is related to its vibration sensitivity. Many researchers have much interest in studying the resonant frequency and sensitivity analysis of AFM cantilevers [2 4]. Cracks may be ...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2012
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.4746277